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 CE
CHENYI ELECTRONICS FEATURES
. Silicon epitaxial planar diode . Fast swithching diodes . 500mW power dissipation . The diode is also available in the Mini-MELF case with the type designation LL4448
1N4448
SMALL SIGNAL SWITCHING DIODE
MECHANICAL DATA
. Case: MinMelf glass case(SOD- 80) . Weight: Approx. 0.05gram
Dimensions in inches and (millimeters)
MAXIMUM RATINGS AND ELECTRICAL CHARACTERISTICS
(Ratings at 25 ambient temperature unless otherwise specified)
Symbol
Reverse voltage Peak reverse voltage Average rectified current, Half wave rectification with Resistive load at TA=25 and F 50Hz IFSM Ptot TJ VR VRM IAV
Value 75 100 1501)
Units
Volts Volts mA
Surge forward current at t<1S and TJ=25 Power dissipation at TA=25 Junction temperature Storage temperature range
500 5001) 175 -65 to + 175
mW mW
TSTG
1)Valid provided that at a distance of 8mm from case are kept at ambient temperature(DO-35)
ELECTRICAL CHARACTERISTICS
(Ratings at 25 ambient temperature unless otherwise specified)
Symbols
Forward voltage at IF=5mA at IF=10mA Leakage current at VR=20V at VR=75V at VR=20V, TJ=150 Junction capacitance at VR=VF=0V Reverse breakdown voltage tested with 100 A puse Reverse recovery time from IF=10mA to IR=1mA, VR=6V, RL=100 Thermal resistance junction to ambient Rectification efficience at f=100MHz,VRF=2V R
JA
Min. 0.62
Typ.
Max. 0.72 1 25 5 50 4
Units V V nA A A pF V
VF VF IR IR IR CJ V(BR)R trr
100 4
ns 3501)
3501) 0.45
1)Valid provided that leads at a distance of 8mm from case are kept at ambient temperature(DO-35) Copyright @ 2000 SHANGHAI CHENYI ELECTRONICS CO.,LTD
Page 1 of 3
CE
CHENYI ELECTRONICS
1N4448
SMALL SIGNAL SWITCHING DIODE
RATINGS AND CHATACTERISTIC CURVES LL4448
FIG.2-DYNAMIC FORWARD RESISTANCE FLG.1-FORWARD CHARACTERISTICS VERSUS FORWARD CURRENT
FIG.3-ADMISSIBLE POWER DISSIPATION VERSUS AMBIENT TEMPERATURE
FIG.4-RELATIVE CAPACITANCE VERSUS VOLTAGE
Copyright @ 2000 SHANGHAI CHENYI ELECTRONICS CO.,LTD
Page 2 of 3
CE
CHENYI ELECTRONICS
1N4448
SMALL SIGNAL SWITCHING DIODE
FIG.5-RECTIFICATION EFFICIENCY MEASUREMENT CIRCUIT
FIG.6-LEAKAGE CURRENT VERSUS JUNCTION
TEMPERATURE
FIG.7-ADMISSIBLE REPETITIVE PEAK FORWARD CURRENT VERSUS PULSE DURATION
Copyright @ 2000 SHANGHAI CHENYI ELECTRONICS CO.,LTD
Page 3 of 3


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